Description
The PIKE Technologies VeeMAX™ III is a high performance and highly versatile specular reflectance accessory designed to analyze a wide range of samples. From monolayers to relatively thick films, the VeeMAX with variable angle of incidence can be optimized for all specular applications. The unique optical design of this product (U.S. Patent No. 5,106,196) enables the accessory to be in alignment for all angles of incidence. The angle may be varied continuously from thirty to eighty five degrees by the rotation of a single control. The sample is placed face down on the sampling surface. Because of the unrestricted access to the sampling area, large samples may be readily analyzed. To suit different sampling geometries, masks with 2″, 5/8″ and 3/8″ apertures are provided. Thanks to the optical design of this accessory, excellent throughput is available even at high angles of incidence. The VeeMAX has a built-in polarizer mount to permit selection of polarization angle without disturbing purge.
An optional motorized version of the accessory is available. It features a stepper motor with complementary electronics, Motion Control Unit, and PIKE Technologies AutoPRO software. In this combination, operation of the VeeMAX can be integrated with the spectrometer software, which allows the operator to precisely and reliably control a wide range of angles of incidence and data collection simultaneously from the computer keyboard.
Selectable angle of incidence – from 30 to 80 degrees in one degree increments
Measurement of thin films and monolayers to relatively thick films
Optimize specular reflectance results with selectable angle of incidence
Integrated position for IR polarization – essential for monolayer analysis and study of sample orientation
Optional single reflection ATR crystals – see ATR section
Motorized version option with electronic control module and AutoPRO software for automated, high-precision experiments
Sealed and purgeable optical design to eliminate water vapor and carbon dioxide interferences
Proprietary beam path within the VeeMax II Specular Reflectance accessory
Optimization of the analysis of a multi-layered coating on metal substrate using the VeeMAX
Changing the angle of incidence with the VeeMAX is very easy. With this research grade specular reflectance accessory, one can measure film thickness ranging from relatively thick to relatively thin, including monolayers, by selecting the optimal angle of incidence for the measurement.
The variable angle of incidence can be controlled manually or with an optional motorized attachment for the VeeMax. Multiple specular measurements at different angles of incidence can be fully automated with the motorized version and PIKE Technologies AutoPRO software. Automation streamlines the collection of spectra from multiple angles of incidence. With the automated VeeMax accessory, the entire experiment can be pre-programmed and executed by the computer.
FTIR spectrum of thiol monolayer measured using the VeeMAX specular reflectance accessory set at 80 degrees angle of incidence, ZnSe polarizer and MCT detector.
Advantages of the automated VeeMax system include:
- Computer controlled precision, accuracy and repeatability
- Synchronization of mirror position changes with collection of sample spectra
- Full integration of the PIKE Technologies AutoPRO software with FTIR spectrometer programs
- Tailor made, predefined experiments
- “Hands-free” operation
Chromatography | Spectroscopy
Supplies | Consumables