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Home | PIKE FTIR Accessories | IR Accessories | ATR Accessories | VeeMAX with ATR
VeeMAX with ATR

VeeMAX with ATR

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Category: ATR Accessories
  • Description

Description

VeeMAX III with ATR – Variable Angle, Single Reflection ATR for Depth Profiling Studies

The VeeMAX III with ATR offers continuous variable angle of incidence and a variety of crystal plates to selectively control the depth of penetration of the IR beam into the sample. The design allows for constant purge, which is not broken upon sample loading, and an integrated polarizer slot. ATR applications include the study of layered samples, coatings, release agents, monolayers on silicon and chemical migration studies. An electrochemical cell add-on is also available to be used with the VeeMAX.

New ATR applications include the study of layered samples, coatings, release agents, monolayers on silicon and chemical migration studies.
The VeeMAX with ATR accessory provides exceptionally high throughput (over 50% with 45 degree ZnSe crystal) to minimize sampling time and enable detection of low concentration components in samples of complex composition. The flat plate crystals offered for the VeeMAX are ideal for solid and layered samples and are designed for use with the optional pressure clamp. The combination of large crystal diameter (20 mm) and slip-clutch pressure clamp provides sample to crystal contact without altering layered sample composition. The optional liquid retainer may be added to the crystal plate for analysis of liquid samples.

Motorized control of angle of incidence via PC for automated data collection of depth profiling studies and ATR measurements is available as an option for the accessory. The motorized VeeMAX option is ideal for depth profiling studies as it greatly speeds and improves the precision and reproducibility of the data collection process.

VeeMAX with ATR optical layout

Depth profiling study of layered polymer film. FTIR spectra collected using ZnSe crystal at set angles of incidence from 43 to 65 degrees. IR absorbance band at 1591 cm-1 clearly increases relative to other bands as we probe deeper into the sample.

Analysis of monomolecular layer on silicon – VeeMAX II with 60 degree Ge crystal, pressure clamp with 7.8 mm tip and p polarization.

  • Continuously variable set angle of incidence – 30 to 75 degrees
  • 0.4 to 46 micron depth of penetration – dependent on crystal material, angle of incidence, sample’s refractive index and wavelength of IR beam – ideal for depth profiling studies
  • High throughput for excellent quality spectra in a short time period
  • Optional, high-pressure clamp for sampling of films, coatings or powdered samples
  • Integrated position for optional manual or automated polarization
  • Motorized option with electronic control module and AutoPRO software for automated, high-precision experiments
  • VeeMAX can be used as a variable angle of incidence specular reflection accessory
  • Sealed and purgeable optical design to eliminate water vapor and carbon dioxide interferences

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