Description
The PIKE Technologies 30Spec™ is ideal for the measurement of relatively thick films by specular reflectance. Samples are simply laid across the top of the accessory and the spectrum of the film is measured within a short time period. The 30Spec includes sample masks of 3/8″, 1/4″ and 3/16″ to define specific sampling areas. The 30Spec provides high quality FTIR spectra for identification of coatings and can also be used to measure coating thickness.
IR throughput is high using the 30Spec due to the relatively simple optical design of the product.
- Measurement of relatively thick films
- Measurement of film thickness by specular reflectance
- Fixed 30 degree angle of incidence
- Sample masks to define sampling area
- Special version – 45Spec for fixed 45 degree angle of incidence
- Slide mount design for easy installation of accessory – fits all FTIR spectrometers
Chromatography | Spectroscopy
Supplies | Consumables