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X, Y Autosampler – Transmission and Reflectance Automated Sampling

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Description

X, Y Autosampler – Transmission and Reflectance Automated Sampling in Microplate Format

The PIKE Technologies X, Y Autosampler is designed around standard 24, 48 or 96 well microplate architectures – ideal for high efficiency sample loading and FTIR analysis. Applications include high throughput analysis of liquid residues and chemical reactions, powdered samples, and automated diffuse reflectance analysis. The X, Y Autosampler is available in standard all reflecting optics and with gold-coated optics for highest performance mid-IR and optimized NIR sampling.

The autosampler features an X, Y stage with both axes driven by high precision stepper motors for speed and reproducibility. Programming and control of the X, Y Autosampler is done through PIKE Technologies AutoPRO software, and is compatible with current FTIR systems.

The optical design is based upon a precision ellipsoidal reflector and the size of the spot illuminated at the sample is approximately 2 mm – ideal for up to 96 well configurations.

PIKE Technologies have developed a special silicon well plate excellent for transmission analysis. This unique 96 well plate provides full mid-IR transmission spectra and is sufficiently durable for extended usage. For diffuse reflection measurements a cavity style plate with standard format placement of samples is available. Please contact us for other configurations.

The quality of FTIR spectra collected on the X, Y Autosampler is excellent – shown in the spectra above for solvent residue samples

  • Complete hardware and software package for automated analysis of industry standard 24, 48, or 96 well plates.
  • Special plate configurations are available.
  • Diffuse reflectance of powdered samples or specular reflectance sampling for reaction residues
  • Gold coated optics version for highest performance mid-IR and NIR sampling
  • Optional transmission sampling with integrated InGaAs detector and transmission sampling plates
  • In-compartment location, purgeable optical path

Specification
Optics: Elliptical – 3X Beam Demagnification
Resolution: 13 microns per step
Accuracy: 25 micrometers per cm
Backlash: < 75 micrometers

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